Sovtest ATE burn-in complexes are made for widespread use in terms of both series production at the stage of product manufacturing and during input control at companies who use microelectronics devices and at companies who perform certificated components’ tests. The bur-in complex can be used when failure-free testing (OST 11 073.013 method 700-1, 700-2.1) and influence testing of high-temperature working environment (OST 11 073.013 method 204). The complex is a module construction and can be easily modified according to customer’s requirements to test performance.

The basis of the complex’s construction is consists of multipurpose warmth chamber with cassettes guides inside. The chamber’s working capacity provides performing burn-in test of microchips set (maximum 16 cassettes in one space, maximum 60 microchips per cassette) with temperature range between +50°С and +160°С. The chamber is supplied with alarm of testing mode increase. Accuracy of temperature control in the chamber working space is ±2°С. The warmth chamber is guided and programmed by external controller.

On customer request complex’s construction can be modified by means of using another type of warmth chamber with less (or more) working capacity.

For voltage supplying on the tested workpiece there included fixed and regulated power sources with the current charge control possibility. For assignment of burn-in electrical modes there apply dynamic input/output modules of development and manufacturing by Sovtest ATE, Ltd.

In case of necessity of additional monitoring and measuring opportunities, the set of standard instruments can be completed with off-brand modules and devices which support PXI, GPIB. For such cases there is support of these standards from complexes side.

Included SDIO6420 dynamic digital modules allow to perform testing at maximum frequency 20 MHz. Each SDIO6420 module consists of 64 bidirectional input/output channels with driver maximum charge capacity 80 mA.

Components under burn-in tests are fixed on cassettes. According to the information given by Sovtest ATE about functional purpose of connector pins fixed in the chamber customer can develop and manufacture cassettes for its own needs.

Software supplied with the complex has got such functions as:

management of complex’s components work;
management of burn-in process (assignment of the modes, contact time, limits and other)
management of process of electrical modes supplement (management programs and drivers for all the assignment and measurement modules)
management of data gathering about burn-in process and statistic storage management;
set of standard programs for burn-in testing of most common components (discrete components, memory microchips)
set-up environment for development of own programs according to certain customer’s tasks.

FTT-17

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Multi-purpose burn-in complex FTT-17